The tiny shell protecting the HIV virus resembles a slightly rounded ice cream cone, but there is nothing sweet about it.

The Focused Ion Beam (FIB) market is an integral segment within the broader landscape of semiconductor manufacturing and materials science. FIB technology has witnessed significant advancements in ...

Two-dimensional (2D) materials promise revolutionary advances in electronics and photonics, but many of the most interesting ...

TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...

TEM works by accelerating electrons, typically with energies between 80 and 300 kV, and directing them through a specimen thin enough for electron transmission. Because of their very short wavelength ...

Observations at the nanoscale can provide profound insights into materials science. Yet, the characterization of beam-sensitive and reactive materials has proven challenging. In order to address this ...

A direct comparison between electron transparent transmission electron microscope (TEM) samples prepared with gallium (Ga) and xenon (Xe) focused ion beams (FIBs) is performed to determine if ...

Abstract: Transmission electron microscopy (TEM) is one of the most important characterization techniques in semiconductor failure analysis. However, preparation of a good TEM lamella for analysis has ...

ZEISS announces the new ZEISS Crossbeam 550 Samplefab, a focused ion beam scanning electron microscope (FIB-SEM) optimized for fully automated preparation of transmission electron microscopy (TEM) ...